| - | A comparison of quantitative analysis for various matrix containing Fe/Ni by depth profiling of dynamic SIMS | LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE |
| - | A Quantitative Analysis for CIGS Thin Films by Dynamic Secondary Ion Mass Spectrometry | LIM, WEON CHEOL; Lee Ji-hye; Won, Sung Ok; LEE, YEON HEE |
| - | A Study of Dynamic SIMS analysis of Cu(In Ga)Se2 (CIGS) | LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE |
| - | Analysis of Natural Dyes in Archaeological Textiles using TOF-SIMS and other Analytical Techniques | Lee Ji-hye; Kim,Man-Ho; LEE, KANG BONG; Elsa van Elslande; Philippe Walter; LEE, YEON HEE |
| - | Applications of surface analytical techniques for organic materials in archaeology or forensic science | LEE, YEON HEE; Lee Ji-hye; S. Ham; LEE, KANG BONG |
| - | Applications of TOF-SIMS for organic materials in archaeology and forensic sicence | LEE, YEON HEE; Lee Ji-hye; Youngsoo, Kim; Seokchan Choi; Seung Wook Ham; LEE, KANG BONG; Chiwoo Lee; Kang-Jin Kim |
| - | Characterization and Sequence Determination of Ball-point Pen Inks and Red Sealing-inks by TOF-SIMS and ATR FT-IR | Lee Ji-hye; Cho Youn Jeong; NAM, YUN SIK; LEE, KANG BONG; LEE, YEON HEE |
| - | Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry | LIM, WEON CHEOL; Lee Ji-hye; Won, Sung Ok; LEE, YEON HEE |
| - | Characterization of Cu(InGa)Se2 (CIGS) thin films in solar cell devices by secondary ion mass spectrometry | LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE |
| - | Characterization of dyed textiles using TOF-SIMS with PCA | Lee Ji-hye; A. Ceglia; 김강진; LEE, YEON HEE |
| - | Characterization of fluorocarbon fhin films deposited by ICP and PP | Lee Ji-hye; K. Kim; LEE, YEON HEE |
| - | Characterization of microphase-separated diblock copolymer films by TOF-SIMS | Lee Ji-hye; Min Hwa Kang; LIM, WEON CHEOL; Kwanwoo Shin; LEE, YEON HEE |
| - | Characterization of Nanostructures in Blend and Copolymer films depend on Annealing Condition | Kang Minhwa; Lee Ji-hye; LEE, YEON HEE |
| - | Chemical composition and lead isotope ratio analysis for iron armor by SIMS | Lee Ji-hye; LEE, YEON HEE; K. Kim |
| - | Comparision of conventional lacquer and cashew coatings by TOF-SIMS and XPS | Lee Ji-hye; LEE, YEON HEE; 함승욱; 김규호; 김강진 |
| - | Comparison of Quantitative Analysis for Photocoltaic CIGS Thin Films by SIMS Depth Profiling with Element Ions and MCs+ Clusters | LEE, YEON HEE; Lee Ji-hye; 김선희; Jang Yun Jung |
| - | Compositional Analysis of Cu(In,Ga)Se2 Thin Films using Various Analytical Techniques | Lee Ji-hye; LEE, YEON HEE |
| - | Depth profiling of lamella phase block copolymer using SIMS | LEE, YEON HEE; Lee Ji-hye; Donghwan Yoon; Kwanwoo Shin |
| - | Identification of Natural Dyes on Ag Nanoparticles by Surface-Enhanced Raman Scattering | Lee Ji-hye; Kim Min Jung; Philippe Walter; LEE, YEON HEE |
| - | Identification of sequence between overlapping signatures of different pen inks by TOF-SIMS imaging | 김선희; Lee Ji-hye; LIM, WEON CHEOL; LEE, YEON HEE |
| - | Investigation for Nano-structured Blend Homopolymers and Diblock Copolymers by AFM and TOF-SIMS | Kang Minhwa; Lee Ji-hye; jimijung; LEE, YEON HEE |
| - | Investigation of Microphase Separation of PS-PPrMA Diblock Copolymer Films by Time-of-Flight Secondary Ion Mass Spectrometry | LEE, YEON HEE; Lee Ji-hye; LIM, WEON CHEOL; 신관우 |
| - | Investigation of natural dyes and ancient textiles from Korea using TOF-SIMS | LEE, YEON HEE; Lee Ji-hye; Youngsoo, Kim; Kang-Jin Kim; Seungwook Ham |
| - | Qualitative analysis of the red stamping inks in the document using TOF-SIMS | Cho Youn Jeang; Lee Ji-hye; 윤정현; LEE, YEON HEE |
| - | Qualitative analysis of the red stamping inks on paper using TOF-SIMS | Lee Ji-hye; Chiwoo Lee; LEE, YEON HEE |
| - | Quantitative Analysis of Metal Alloy by TOF-SIMS Depth Profiling | LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE |
| - | Quantitative surface analysis of binary alloy thin films by depth profiling of TOF-SIMS and Dynamic SIMS | LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE |
| - | Sequence relation and qualitative analysis of various inks using TOF-SIMS | Lee Ji-hye; LEE, YEON HEE; 김강진 |
| - | SIMS Depth profiling of PS-PPrMA diblock coplymers | Lee Ji-hye; K. Kim; LEE, YEON HEE |
| - | Surface Analysis and Depth Profiling of Polymers by TOF-SIMS | LEE, YEON HEE; Lee Ji-hye; 김선희; Kang Minhwa |
