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Browsing byAuthorVaibhav K. Andleigh

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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
-Simulations of stress evolution and the current density scaling of electromigration-induced failure times in pure and alloyed interconnectsVaibhav K. Andleigh; PARK YOUNG JOON; Carl V. Thompson
-ULSI interconnect failures due to electromigration-induced stress evolution: computer simulation studyPARK YOUNG JOON; Vaibhav K. Andleigh; Carl V. Thompson; 최인석; 주영창
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