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Showing results 1 to 4 of 4

Issue DateTitleAuthor(s)
-Algorithm for EUV Mask Actinic CD Measurement using Scattered LightCho Jung-gyn; Kim Ki Hyuk; 이동수; Park, Min-Chul; Jhon, Young Min; Kim, Yong Tae
-Coherent scattering stereoscopic microscopy for mask inspection of extreme ultra-violet lithographyKim Ki Hyuk; Cho Jung-gyn; Park, Min-Chul; Ju, Byeong-Kwon; Cho Sung-jin; Son, Jung-Young
-Enhancement of Reconstructed Image by Noise Reduction for Mask Inspection of EUVL (Extreme Ultra-Violet Light) LithographyCho Jung-gyn; Cho Sung-jin; Park, Min-Chul; Jhon, Young Min; Byeong-Kwon Ju; Jung-Young Son
-Light Intensity Simulation in Real Space by Viewing Locations for Autostereoscopic Display DesignCho Jung-gyn; Lee, Kwang-Hoon; Dong-Su Lee; Park, Min-Chul; Son, Jung-Young; Ju, Byeong-Kwon
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