Showing results 1 to 6 of 6
Issue Date | Title | Author(s) |
---|---|---|
1993-01-15 | DEPOSITION TEMPERATURE-DEPENDENCE OF ELECTRICAL INSTABILITY IN AN INP METAL-INSULATOR SEMICONDUCTOR CAPACITOR PROVIDED BY PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITED SILICON-NITRIDE | LEE, MB; HAN, IK; LEE, YJ; LEE, JI; KANG, KN; LIM, H |
1992-05-16 | EFFECTS OF CARRIER-VELOCITY SATURATION ON THE CHARACTERISTICS OF SHORT CHANNEL MOSFETS WITH LIGHTLY DOPED DRAINS | LEE, MB; LEE, JI; KANG, KN; YOON, KS; HONG, S; LIM, KY |
1989-05-25 | MOBILITY REDUCTION PARAMETERS IN SHORT-CHANNEL MOSFETS | LEE, JI; LEE, MB; KANG, KN; PARK, KO |
1990-05-01 | RELATIONSHIP BETWEEN CRYSTALLIZATION PROCESS AND MAGNETIC-PROPERTIES OF FE-(CU-NB)-SI-B AMORPHOUS-ALLOYS | NOH, TH; LEE, MB; KIM, HJ; KANG, IK |
1990-06-21 | SIMPLE EXTRACTION METHOD FOR MOBILITY PARAMETERS IN SI-MOSFETS AT 77-K | LEE, JI; LEE, MB; KANG, KN; PARK, KO |
1990-10-11 | SIMPLE METHOD TO EXTRACT GATE VOLTAGE DEPENDENT SOURCE DRAIN RESISTANCE IN MOSFETS | LEE, JI; LEE, MB; LEE, YJ; HAN, IK; KANG, KN; PARK, KO |