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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
1991-01Simple model for gate-voltage dependent parasitic resistance in short channel lightly doped drain metal oxide semiconductor field effect transistors.강광남; 이정일; 이명복; S. Y. Lee; 윤경식
-Writing Current Reduction for High-density Phase-change RAMY.N. Hwang,; S. H. Lee; S. J. Ahn; S. Y. Lee; K. C. Ryoo; H. S. Hong; Koo, Hyun Cheol; Y. Fai; J. H. Oh; H. J. Kim; W. C. Jeong; J. H. Park; H. Horii; Y. H. Ha; J.H. Yi; G. H. Koh; G. T. Jeong; H. S. Jeong; Kinam Kim
1

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