| 1999-01 | Correlation between morphological and electrical characteristics of Pt/SrBi2Ta2O9/CeO2/Si capacitors | Lee, HN; Choh, SH; Shin, DS; Kim, YT |
| 1997-09 | Effect of the processing methods on the formation of Al4C3 in SiCp/2024 Al composites | Shin, DS; Lee, JC; Yoon, EP; Lee, HI |
| 1999-09-15 | Effects of Bi-Pt alloy on electrical characteristics of Pt/SrBi2Ta2O9/CeO2/Si ferroelectric gate structure | Kim, YT; Shin, DS; Park, YK; Choi, IH |
| 1998-09 | Effects of morphological changes of Pt/SrBi2Ta2O9 interface on the electrical properties of ferroelectric capacitor | Shin, DS; Lee, HN; Lee, CW; Kim, YT; Choi, IH |
| 1998-08 | Electrical properties of Pt/SrBi2Ta2O9/CeO2/SiO2/Si structure for nondestructive readout memory | Shin, DS; Lee, HN; Kim, YT; Choi, IH; Kim, BH |
| 1997-12-15 | Memory window of Pt/SrBi2Ta2O9/CeO2/SiO2/Si structure for metal ferroelectric insulator semiconductor field effect transistor | Kim, YT; Shin, DS |
| 1998-08 | Optical bistability in a semiconductor etalon with nonlinear integrated mirrors | Yoon, TH; Shin, DS; Kim, DB; Kim, JC; Kim, SH |
| 2000-02 | SrBi2Ta2O9 thin films grown by MOCVD using a novel double metal alkoxide precursor | Shin, DS; Choi, HS; Kim, YT; Choi, IH |
| 2002-05-01 | Surface structure of Pt/Si(001) | Choi, DS; Jung, JW; Shin, DS; Yoon, MS; Cho, WS; Kim, JY; Chae, KH; Jeong, KH; Whang, CN |
| 1999 | The phase transition of Bi-Pt alloys at the interface of Pt/SrBi2Ta2O9 and its effect on interface roughness | Shin, DS; Lee, HN; Kim, YT; Park, YK; Choi, IH |
