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Showing results 1 to 10 of 10

Issue DateTitleAuthor(s)
2009-06Atomic arrangement variations of 30 degrees in-plane rotation domain boundaries in ZnO thin films grown on Si substrates due to thermal annealingShin, J. W.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K.
2007-04-30Atomic arrangement variations of [0001]-tilt grain boundaries in ZnO thin films grown on p-Si substrates due to thermal treatmentShin, J. W.; Lee, J. Y.; No, Y. S.; Jung, J. H.; Kim, T. W.; Choi, W. K.
2006-09-04Correlation between the atomic structures and the misorientation angles of [0001]-tilt grain boundaries at triple junctions in ZnO thin films grown on Si substratesShin, J. W.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K.
2007-03Effect of thermal annealing on the formation of preferential c-axis orientation and an interfacial layer for ZnO thin films grown on an n-Si (001) substrateYuk, J. M.; Shin, J. W.; Lee, J. Y.; Son, D. I.; Jung, J. H.; Kim, T. W.; Kim, J. Y.; Choi, W. K.
2011-06-15Effects of different annealing atmospheres on the surface and microstructural properties of ZnO thin films grown on p-Si (100) substratesShin, J. W.; No, Y. S.; Lee, J. Y.; Kim, J. Y.; Choi, W. K.; Kim, T. W.
2006-07-01Effects of thermal treatment on the formation of the columnar structures in ZnO thin films grown on p-Si(100) substratesShin, J. W.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K.
2008-10Formation and Microstructural Properties of Locally Distributed ZnSiO3 Nanoparticles Embedded in a SiO2 Layer by Using a Focused Electron BeamShin, J. W.; No, Y. S.; Kim, T. W.; Choi, W. K.
2011-02Formation mechanisms of ZnO nanocrystals embedded in an amorphous Zn2xSi1-xO2 layer due to sputtering and annealingShin, J. W.; Lee, J. Y.; No, Y. S.; Kim, T. W.; Choi, W. K.
2009-02-18Irradiation-induced shrinkage and expansion mechanisms of SiO2 circle membrane nanoporesShin, J. W.; Lee, J. Y.; Lee, D. U.; Oh, D. H.; Kim, D. H.; Kim, T. W.; Cho, W. J.; Jin, S.
2008-07-23The formation mechanism of periodic Zn nanocrystal arrays embedded in an amorphous layer by rapid electron beam irradiationShin, J. W.; Lee, J. Y.; No, Y. S.; kim, T. W.; Choi, W. K.; Jin, S.
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