| - | Effects of Bottom Electrode and Environmental Insulator on Thermal Distribution of Edge Contact Type PRAM Cell | Kim, Yong Tae; Youm Min Soo; Sung Man Young |
| - | Effects of Cell Structure and Contact Dimension on Phase Change Random Access Memory | Kim, Yong Tae; Youm Min Soo; Sung Man Young |
| - | EFFECTS OF SCALED CONTACT DIMENSION ON PHASE CHANGE RANDOM ACCESS MEMORY | Kim, Yong Tae; Park Yu Jin; Kwon Young Suk; Youm Minsoo; Sung Man Young |
| - | ELECTRICAL CHARACTERISTICS OF LOW-TEMPERATURE CRYSTALLIZED SrBi2Nb2O9 THIN FILMS FOR FET TYPE FERAM | Kim, Yong Tae; KIM IK SOO; Youm Minsoo; Sung Man Young |
| - | Material and Electrical Characteristics of SbXTe100-X for Phase Change Random Access Memory | Kim, Yong Tae; Kwon Young Suk; Youm Min Soo; Sung Man Young |
| - | Material and Electrical Characteristics of SbxTe100-x for Phase Change Random Access Memory | Kim, Yong Tae; Youm Min Soo; Lee Dong Ho; Kang Gil Bum; Sung Man Young |
| - | Scaling of Phase Changing Volume Dimension and Material Issues on Phase Change Random Access Memory | Kim, Yong Tae; Youm Min Soo; Kwon Young Suk; Sung Man Young |
