| 2001-10 | Change in electrical characteristics of poly(p-phenylene vinylene)-based self-assembled devices by addition of ionic salt to poly(sodium 4-styrenesulfonate) | Cho, J; Char, K; Kim, SY; Hong, JD; Kim, DY; Lee, KB |
| 2001-07 | Application of phase contrast imaging atomic force microscopy to tribofilms on DLC coatings | Ahn, HS; Chizhik, SA; Dubravin, AM; Kazachenko, VP; Popov, VV |
| 2001-06 | Photoresponse of Si detector based on n-ZnO/p-Si and n-ZnO/n-Si structures | Kim, HY; Kim, JH; Kim, YJ; Chae, KH; Whang, CN; Song, JH; Im, S |
| 2001-09 | The effect of humidity on the rolling resistance of silver coatings modified by plasma surface treatments | Yang, SH; Kong, H; Choi, SC; Kim, DE |
| 2001-03 | Measurements of thermal diffusivity for thin slabs by a converging thermal wave technique | Joo, Y; Park, H; Chae, HB; Lee, JK; Baik, YJ |
| 2001-03 | Electrical and structural properties of Ti/Au ohmic contacts to n-ZnO | Kim, HK; Han, SH; Seong, TY; Choi, WK |
| 2001-01-15 | Optical and electrical properties of Ge-implanted SiO2 layers on n-Si and p-Si | Lee, WS; Jeong, JY; Kim, HB; Chae, KH; Whang, CN; Im, S; Song, JH |
| 2001-06 | Visible photoluminescence from porous poly-Si/Si and amorphous-Si/Si structures | Kim, MG; Yun, Z; Lyou, J; Cho, S; Park, YJ; Kim, EK |
| 2001-05-03 | Low-threshold amplified spontaneous emission in a fluorene-based liquid crystalline polymer blend | Kim, YC; Lee, TW; Park, OO; Kim, CY; Cho, HN |
| 2001-04 | Slow crack growth behavior in Si3N4 sintered with Yb2Si2O7 tie-line composition additives | Choi, HJ; Kim, HJ; Lee, JG; Kim, YW |
