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Issue DateTitleAuthor(s)
2001-07Application of phase contrast imaging atomic force microscopy to tribofilms on DLC coatingsAhn, HS; Chizhik, SA; Dubravin, AM; Kazachenko, VP; Popov, VV
2001-01-15Optical and electrical properties of Ge-implanted SiO2 layers on n-Si and p-SiLee, WS; Jeong, JY; Kim, HB; Chae, KH; Whang, CN; Im, S; Song, JH
2001-12Postannealing effect of GaN on reactive ion beam pre-treated sapphireLee, SJ; Byun, D; Ko, J; Hong, CH; Kim, G
2001-04Slow crack growth behavior in Si3N4 sintered with Yb2Si2O7 tie-line composition additivesChoi, HJ; Kim, HJ; Lee, JG; Kim, YW
2001-10Change in electrical characteristics of poly(p-phenylene vinylene)-based self-assembled devices by addition of ionic salt to poly(sodium 4-styrenesulfonate)Cho, J; Char, K; Kim, SY; Hong, JD; Kim, DY; Lee, KB
2001-06Photoresponse of Si detector based on n-ZnO/p-Si and n-ZnO/n-Si structuresKim, HY; Kim, JH; Kim, YJ; Chae, KH; Whang, CN; Song, JH; Im, S
2001-03Electrical and structural properties of Ti/Au ohmic contacts to n-ZnOKim, HK; Han, SH; Seong, TY; Choi, WK
2001-09The effect of humidity on the rolling resistance of silver coatings modified by plasma surface treatmentsYang, SH; Kong, H; Choi, SC; Kim, DE
2001-03Soft X-ray fluorescence and photoluminescence of Si nanocrystals embedded in SiO2Chang, GS; Son, JH; Chae, KH; Whang, CN; Kurmaev, EZ; Shamin, SN; Galakhov, VR; Moewes, A; Ederer, DL
2001-05-03Low-threshold amplified spontaneous emission in a fluorene-based liquid crystalline polymer blendKim, YC; Lee, TW; Park, OO; Kim, CY; Cho, HN