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Issue DateTitleAuthor(s)
2016-09-05Effect of spark plasma sintering conditions on the thermoelectric properties of (Bi0.25Sb0.75)(2)Te-3 alloysLim, Sang-Soon; Kim, Ju-Heon; Kwon, Beomjin; Kim, Seong Keun; Park, Hyung-Ho; Lee, Ki-Suk; Baik, Jeong Min; Choi, Won Jun; Kim, Dong-Ik; Hyun, Dow-Bin; Kim, Jin-Sang; Baek, Seung-Hyub
2016-12-14Harman Measurements for Thermoelectric Materials and Modules under Non-Adiabatic ConditionsRoh, Im-Jun; Lee, Yun Goo; Kang, Min-Su; Lee, Jae-Uk; Baek, Seung-Hyub; Kim, Seong Keun; Ju, Byeong-Kwon; Hyun, Dow-Bin; Kim, Jin-Sang; Kwon, Beomjin
2016-11Correct Extraction of Frequency Dispersion in Accumulation Capacitance in InGaAs Metal-Insulator-Semiconductor DevicesLee, Woo Chul; Cho, Cheol Jin; Choi, Jung-Hae; Song, Jin Dong; Hwang, Cheol Seong; Kim, Seong Keun
2016-08Free-electron creation at the 60 degrees twin boundary in Bi2Te3Kim, Kwang-Chon; Lee, Joohwi; Kim, Byung Kyu; Choi, Won Young; Chang, Hye Jung; Won, Sung Ok; Kwon, Beomjin; Kim, Seong Keun; Hyun, Dow-Bin; Kim, Hyun Jae; Koo, Hyun Cheol; Choi, Jung-Hae; Kim, Dong-Ik; Kim, Jin-Sang; Baek, Seung-Hyub
2016-05-20Correction of the Electrical and Thermal Extrinsic Effects in Thermoelectric Measurements by the Harman MethodKang, Min-Su; Roh, Im-Jun; Lee, Yun Goo; Baek, Seung-Hyub; Kim, Seong Keun; Ju, Byeong-Kwon; Hyun, Dow-Bin; Kim, Jin-Sang; Kwon, Beomjin
2016-05Wafer-scale growth of MoS2 thin films by atomic layer depositionPyeon, Jung Joon; Kim, Soo Hyun; Jeong, Doo Seok; Baek, Seung-Hyub; Kang, Chong-Yun; Kim, Jin-Sang; Kim, Seong Keun
2016-05Polarity-tunable spin transport in all-oxide multiferroic tunnel junctionsSoni, Rohit; Petraru, Adrian; Nair, Harikrishnan S.; Vavra, Ondrej; Ziegler, Martin; Kim, Seong Keun; Jeong, Doo Seok; Kohlstedt, Hermann
2016-06Interfacial control of oxygen vacancy doping and electrical conduction in thin film oxide heterostructuresVeal, Boyd W.; Kim, Seong Keun; Zapol, Peter; Iddir, Hakim; Baldo, Peter M.; Eastman, Jeffrey A.
2016-05-23Leaky Integrate-and-Fire Neuron Circuit Based on Floating-Gate IntegratorKornijcuk, Vladimir; Lim, Hyungkwang; Seok, Jun Yeong; Kim, Guhyun; Kim, Seong Keun; Kim, Inho; Choi, Byung Joon; Jeong, Doo Seok
2016-02Thickness-Dependent Electrocaloric Effect in Pb0.9La0.1Zr0.65Ti0.35O3 Films Grown by Sol-Gel ProcessRoh, Im-Jun; Kwon, Beomjin; Baek, Seung-Hyub; Kim, Seong Keun; Kim, Jin-Sang; Kang, Chong-Yun

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