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Issue DateTitleAuthor(s)
2019-11Mutual Conservation of Redox Mediator and Singlet Oxygen Quencher in Lithium-Oxygen BatteriesKwak, Won-Jin; Freunberger, Stefan A.; Kim, Hun; Park, Jiwon; Trung Thien Nguyen; Jung, Hun-Gi; Byon, Hye Ryung; Sun, Yang-Kook
2019-11Properties of CoS2/CNT as a Cathode Material of Rechargeable Aluminum-Ion BatteriesZhang, Kaiqiang; Lee, Tae Hyung; Cha, Joo Hwan; Jang, Ho Won; Shokouhimehr, Mohammadreza; Choi, Ji-Won
2019-11S@GO as a High-Performance Cathode Material for Rechargeable Aluminum-Ion BatteriesZhang, Kaiqiang; Lee, Tae Hyung; Cha, Joo Hwan; Jang, Ho Won; Shokouhimehr, Mohammadreza; Choi, Ji-Won
2019-11Epitaxial Lift-Off Technology for Large Size III-V-on-Insulator SubstrateLee, Subin; Kim, Seong Kwang; Han, Jae-Hoon; Song, Jin Dong; Jun, Dong-Hwan; Kim, Sang-Hyeon
2019-12Activity Origin and Multifunctionality of Pt-Based Intermetallic Nanostructures for Efficient ElectrocatalysisKim, Ho Young; Kim, Jong Min; Ha, Yoonhoo; Woo, Jinwoo; Byun, Ayoung; Shin, Tae Joo; Park, Kang Hyun; Jeong, Hu Young; Kim, Hyungjun; Kim, Jin Young; Joo, Sang Hoon
2019-12Elucidating the performance-limiting electrode for all-vanadium redox flow batteries through in-depth physical and electrochemical analysesMehboob, Sheeraz; Ali, Ghulam; Abbas, Saleem; Chung, Kyung Yoon; Ha, Heung Yong
2019-12Web-drive based source measure unit for automated evaluations of ionic liquid-gated MoS2 transistorsPark, So Jeong; Jeon, Dae-Young; Moon, Young-Sun; Park, Il-Hoo; Kim, Gyu-Tae
2019-12Approximation of transient redox boundary conditions: its application to numerical analysis of iron plume migration near landfillsChung, Jaeshik; Chung, Jae H.; Townsend, Timothy G.
2019-12Influence of combinatory effects of STEM setups on the sensitivity of differential phase contrast imagingLee, Gwangyeob; Jeong, Juyoung; Schwarzhuber, Felix; Zweck, Josef; Kim, Jeehoon; Kim, Do Hyang; Chang, Hye Jung
2019-12The Importance of p-Doping for Quantum Dot Laser on Silicon PerformanceNorman, Justin C.; Zhang, Zeyu; Jung, Daehwan; Shang, Chen; Kennedy, M. J.; Dumont, Mario; Herrick, Robert W.; Gossard, Arthur C.; Bowers, John E.

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