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Quantitative Analysis of Metal Alloy by TOF-SIMS Depth Profiling

Other Titles

TOF-SIMS의 Depth Profiling을 이용한 금속의 정량분석

Authors

LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE

Citation

한국분석과학회, v.42, pp.68

Keywords

TOF-SIMS; 정량분석; 표면분석; 금속합금

URI

https://pubs.kist.re.kr/handle/201004/101403

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KIST Conference Paper > Others

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