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Microstructural analysis of in doped Ge-Sb-Te thin films using high voltage electron microscopy

Authors

Y. I. Kim; Eun Tae Kim; Jeong Yong Lee; Kim, Yong Tae

Citation

The 9th Asia-Pacific Microscopy Conference(APMC), pp.92

URI

https://pubs.kist.re.kr/handle/201004/101932

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KIST Conference Paper > Others

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