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Fabrication and Characteristics of Metal-Ferroelectric-Metal-Insulator-Semiconductor field-effect transistor

Authors

Kim, Yong Tae; SHIM, SUN IL; Kim, Young Hwan; Kim, Seong Il

Citation

The International Conference on Electrical Engineering 2005 (ICEE2005)

Keywords

FeRAM; memory; Ferroelectric; MFMISFET

URI

https://pubs.kist.re.kr/handle/201004/104803

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KIST Conference Paper > Others

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