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Reduction of phase changing voltage in Phase change random access memory by using edge contact structure

Authors

Kim, Yong Tae; Minsoo Youm; SHIN, SUN IL; Kim, Seong Il

Citation

International Conference on Electrical Engineering 2004, v.1, pp.20 - 23

URI

https://pubs.kist.re.kr/handle/201004/105573

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KIST Conference Paper > Others

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