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Electrical Properties of Field Effect Transistor with (Bi,La)Ti3O12 Ferroelectric Gate Film on Y2O3/Si Substrate

Authors

Ho Jung Chang; Kang Mo Suh; Park Ji Ho; Ho Sung Chang; Soon Chan Hong; Kim, Yong Tae; Makoto Ishida

Citation

International Conference on Electrical Engineering 2004, v.1, pp.1 - 6

URI

https://pubs.kist.re.kr/handle/201004/105576

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KIST Conference Paper > Others

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