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Fabrication and characterization of bolometric oxide thin film based on vanadium-tungsten alloy

Authors

HAN YONG HEE; Kim Kun Tae; NGUYEN CHI ANH; Shin, Hyun Joon; Choi In Hoon; Moon, Sung Wook

Citation

EUROSENSORS 2004

Keywords

vanadium-tungsten alloy; oxidation; microbolometer

URI

https://pubs.kist.re.kr/handle/201004/105813

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KIST Conference Paper > Others

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