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Noise spectroscopy for semiconductor structures

Authors

Lee Jung Il; J. Brini; A. Chovet; C.A. Dimitriadis

Citation

Proceedings of the 3rd Korea-China Joint Workshop on Advanced Materials, pp.329 - 333

Keywords

low frequency noise; semiconductor; noise spectroscopy; thermal activation

URI

https://pubs.kist.re.kr/handle/201004/109084

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KIST Conference Paper > Others

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