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Microstructural characterization of epitaxial PbTiO ₃ thin films usig synchrotron X-ray diffraction

Authors

LEE KYEONG SEOK; 백성기

Citation

11th International Symposium on Integrated Ferroelectrics, Colorado, USA, March 7-10, 1999., pp.?

Keywords

domain structure; synchrotron X-ray diffraction; epitaxial PZT thin film

URI

https://pubs.kist.re.kr/handle/201004/109399

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KIST Conference Paper > Others

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