DSpace at KISTKIST Conference PaperOthers

Full metadata record

DC Field Value Language
dc.contributor.authorLEE YEON HEE-
dc.contributor.authorHAN SEUNG HEE-
dc.contributor.author윤정현-
dc.contributor.authorKIM YOUNG MAN-
dc.contributor.author손성건-
dc.contributor.author박성우-
dc.date.accessioned2024-01-13T18:03:24Z-
dc.date.available2024-01-13T18:03:24Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/109831-
dc.languageEnglish-
dc.subjectpaint-
dc.subjectTOF-SIMS-
dc.subjectforensic-
dc.subjectdepth profile-
dc.titleIdentification of automotive paints using time-of-flight secondary ion mass spectrometry-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationAA6, pp.80-
dc.citation.titleAA6-
dc.citation.startPage80-
dc.citation.endPage80-
dc.citation.conferencePlaceBE-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE