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Identification of automotive paints using time-of-flight secondary ion mass spectrometry

Authors

LEE YEON HEE; HAN SEUNG HEE; 윤정현; KIM YOUNG MAN; 손성건; 박성우

Citation

AA6, pp.80

Keywords

paint; TOF-SIMS; forensic; depth profile

URI

https://pubs.kist.re.kr/handle/201004/109831

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KIST Conference Paper > Others

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