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Determination of oxidation state of tin by photoemission and AES: using SnOx thin films grown by reactive ion assisted deposition

Authors

CHOI WON-KOOK; J.S. Cho; H.G. Jang; S.K. Song; 정형진; KOH SEOK KEUN

Citation

The 2nd Korea-Japan surface and interface symposium (Seoul, Feb. 1996), pp.?

URI

https://pubs.kist.re.kr/handle/201004/111339

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