KIST Library Institutional Repository

Direct shrinkage observation of oxidation induced stacking faults in p-type CZ silicon.

Authors

Kim Yong Tae; Min Suk-Ki

Citation

Proc. 1986 Seoul int. symp. phys. semicond. & appl., pp.?

URI

https://pubs.kist.re.kr/handle/201004/111358

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML