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dc.contributor.authorOH MYUNG HWAN-
dc.contributor.authorK. C. Park-
dc.contributor.authorJ. H. Moon-
dc.contributor.authorS. J. Chung-
dc.contributor.authorW. Milne-
dc.contributor.authorJ. Jang-
dc.date.accessioned2024-01-13T21:02:32Z-
dc.date.available2024-01-13T21:02:32Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/111369-
dc.languageEnglish-
dc.subjectfield emission display-
dc.titleRelationship between field emission characteristics and hydrogen content in DLC deposited by layer-by-layer technique using PECVD.-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationTechnical digest of 9th international vacuum microelectronics conference, St. Petersburg, Russia., pp.268 - 272-
dc.citation.titleTechnical digest of 9th international vacuum microelectronics conference, St. Petersburg, Russia.-
dc.citation.startPage268-
dc.citation.endPage272-
dc.citation.conferencePlaceKO-
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