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Relationship between field emission characteristics and hydrogen content in DLC deposited by layer-by-layer technique using PECVD.

Authors

OH MYUNG HWAN; K. C. Park; J. H. Moon; S. J. Chung; W. Milne; J. Jang

Citation

Technical digest of 9th international vacuum microelectronics conference, St. Petersburg, Russia., pp.268 - 272

Keywords

field emission display

URI

https://pubs.kist.re.kr/handle/201004/111369

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KIST Conference Paper > Others

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