KIST Library Institutional Repository

The effect of surface morphology on the defect density of GaN..

Authors

Kum Dong Wha; Byun Dongjin; Kim Gyeung Ho

Citation

8th Seoul inter. symp. on the physics of semiconductors and applications-1996(96-ISPSA), Oct. 21-22,, pp.?

URI

https://pubs.kist.re.kr/handle/201004/111570

Appears in Collections:

KIST Conference Paper > Others

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML