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dc.contributor.authorJung Woo Sang-
dc.contributor.author김병준-
dc.contributor.author최길현-
dc.contributor.authorLEE SUNG MIN-
dc.contributor.author고영범-
dc.date.accessioned2024-01-13T22:00:25Z-
dc.date.available2024-01-13T22:00:25Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/111786-
dc.languageEnglish-
dc.subjectH//2O emission from SOG-
dc.titleThe effect of H//2O from SOG on the reliability of sub-micron vias.-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation제 56 회 응용물리학회 학술강연회 , Kanazawa, v.Process 기술 B, pp.?-
dc.citation.title제 56 회 응용물리학회 학술강연회 , Kanazawa-
dc.citation.volumeProcess 기술 B-
dc.citation.startPage?-
dc.citation.endPage?-
dc.citation.conferencePlaceJA-
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