Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Lee, Taeju | - |
dc.contributor.author | Park, Jee-Ho | - |
dc.contributor.author | Cha, Ji-Hyoung | - |
dc.contributor.author | Chou, Namsun | - |
dc.contributor.author | Je, Minkyu | - |
dc.contributor.author | Kim, Ji-Hoon | - |
dc.contributor.author | Cho, Il-Joo | - |
dc.contributor.author | Kim, Seong-Jin | - |
dc.contributor.author | Jang, Doojin | - |
dc.date.accessioned | 2024-01-19T10:08:21Z | - |
dc.date.available | 2024-01-19T10:08:21Z | - |
dc.date.created | 2022-02-28 | - |
dc.date.issued | 2019-06 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/114084 | - |
dc.description.abstract | This paper presents a multimodal multichannel neural activity readout IC which can perform not only the electrical recording (ER) but also the fluorescence recording (FR) of neural activity for the cell-type-specific study of heterogeneous neuronal cell populations. The time-based FR circuit senses Ca2+ concentration using Ca(2+)probes while the ER circuit acquires action potentials (APs) and local field potentials (LFPs). The IC is fabricated in 0.18 mu m CMOS, The FR circuit achieves a recording range of 81dB (75pA to 860nA) and consumes the power of 0.7 mu W/Ch. The ER circuit achieves the input-referred noise (IRN) of 2.7 mu V-rms over the bandwidth (BW) of 10kHz, while consuming the power of 4.9 mu W/Ch. The in-vitro measurement is performed for recording Ca2+ concentration and electrical neural signals. | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | A Multimodal Multichannel Neural Activity Readout IC with 0.7 mu W/Channel Ca2+-Probe-Based Fluorescence Recording and Electrical Recording | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | Symposium on VLSI Technology / 33rd Symposium on VLSI Circuits, pp.C290 - C291 | - |
dc.citation.title | Symposium on VLSI Technology / 33rd Symposium on VLSI Circuits | - |
dc.citation.startPage | C290 | - |
dc.citation.endPage | C291 | - |
dc.citation.conferencePlace | US | - |
dc.citation.conferencePlace | Kyoto, JAPAN | - |
dc.citation.conferenceDate | 2019-06-09 | - |
dc.relation.isPartOf | 2019 SYMPOSIUM ON VLSI CIRCUITS | - |
dc.identifier.wosid | 000531736500098 | - |
dc.identifier.scopusid | 2-s2.0-85073899513 | - |
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