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Equivalent oxide thickness scaling for efficient III-V/Si hybrid MOS optical phase shifter

Authors

Li, Qiang; Han, Jae-Hoon; Takenaka, Mitsuru; Takagi, Shinichi; Lee, Tsung-En

Issue Date

2019-05

Publisher

IEEE

Citation

Compound Semiconductor Week (CSW) Conference

URI

https://pubs.kist.re.kr/handle/201004/114099

Appears in Collections:

KIST Conference Paper > 2019

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