A Low-noise CMOS SPAD Pixel with 12.1 ps SPTR and 3 ns Dead Time

Authors
Gramuglia, F.Wu, M.Bruschini, C.Lee, M.Charbon, E.
Issue Date
2022-03
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
IEEE Journal of Selected Topics in Quantum Electronics, v.28, no.2
Abstract
In this paper, we present the first CMOS SPAD with performance comparable or better than that of the best custom SPADs, to date. The SPAD-based design, fully integrated in 180 nm CMOS technology, achieves a peak PDP of 55% at 480nm with a very broad spectrum spanning from NUV to NIF and a normalized DCR of 0.2cps/m2, both at 6V of excess bias. Thanks to a dedicated CMOS pixel circuit front-end, an afterpulsing probability of about 0.1% at a dead time of3ns were achieved. We designed three SPADs with a diameter of 25, 50, and 100m to study the impact of size on the timing jitter and to create a scaling law for SPADs. For these SPADs, a SPTR of 12.1ps, 16ps, and 27ps was achieved at 6V of excess bias, respectively. The SPADs operate in a wide range of temperatures, from -65C to 40C, reaching a normalized DCR of 1.6 mcps/m2 at 6V of excess bias. The proposed SPADs are ideal for a wide range of applications, including LiDAR, super-resolution microscopy, QRNGs, QKD, fluorescence lifetime imaging, time-resolved Raman spectroscopy, to name a few. CCBY
Keywords
Fluorescence imaging; Pixels; Afterpulsing; Broad spectrum; CMOS technology; Fluorescence lifetime imaging; Fully integrated; Pixel circuit; Super-resolution microscopy; Time-resolved Raman spectroscopies; CMOS integrated circuits; Active reset; cascode; CMOS technology; Delays; jitter; low noise; low power; photon detection probability (PDP); pixel; quantum key distribution (QKD); Sensitivity; single-photon avalanche diode (SPAD); Single-photon avalanche diodes; Temperature measurement; timing; Transistors; Voltage measurement
ISSN
1077-260X
URI
https://pubs.kist.re.kr/handle/201004/115620
DOI
10.1109/JSTQE.2021.3088216
Appears in Collections:
KIST Article > 2022
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