Hexagonal Boron Nitride Passivation Layer for Improving the Performance and Reliability of InGaN/GaN Light-Emitting Diodes

Authors
Lee, Gun-HeeCuong, Tran-VietYeo, Dong-KyuCho, HyunjinRyu, Beo-DeulKim, Eun-MiNam, Tae-SikSuh, Eun-KyungSeo, Tae-HoonHong, Chang-Hee
Issue Date
2021-10
Publisher
MDPI
Citation
Applied Sciences-basel, v.11, no.19
Abstract
We introduce a low temperature process for coating InGaN/GaN light-emitting diodes (LEDs) with h-BN as a passivation layer. The effect of h-BN on device performance and reliability is investigated. At -5 V, the leakage current of the h-BN passivated LED was -1.15 x 10(-9) A, which was one order lower than the reference LED's leakage current of -1.09 x 10(-8) A. The h-BN layer minimizes the leakage current characteristics and operating temperature by acting as a passivation and heat dispersion layer. With a reduced working temperature of 33 from 45 & DEG;C, the LED lifetime was extended 2.5 times following h-BN passivation. According to our findings, h-BN passivation significantly improves LED reliability.
Keywords
GAN CRYSTALS; light emitting diodes; h-BN; passivation; operating temperature
ISSN
2076-3417
URI
https://pubs.kist.re.kr/handle/201004/116280
DOI
10.3390/app11199321
Appears in Collections:
KIST Article > 2021
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