Metal-Semiconductor Ohmic and Schottky Contact Interfaces for Stable Li-Metal Electrodes
- Authors
- Ardhi, Ryanda Enggar Anugrah; Liu, Guicheng; Lee, Joong Kee
- Issue Date
- 2021-04-09
- Publisher
- AMER CHEMICAL SOC
- Citation
- ACS ENERGY LETTERS, v.6, no.4, pp.1432 - 1442
- Abstract
- Li-metal is an attractive anode material for next-generation batteries owing to its high capacity and low reduction potential. Unfortunately, it undergoes dendritic growth, which limits its development. Herein, amorphous polymeric carbon-based semiconducting passivation layers are applied to Li-metal electrodes using radiofrequency plasma thermal evaporation to suppress dendrite growth. The plasma power is controlled to adjust the semiconducting type and mechanical properties of the plasma-polymerized carbon layer (PCL). n- and p-type semiconducting PCLs (n- and p-PCLs) form ohmic and Schottky contacts, respectively, with the Li-metal. p-PCL was more effective than n-PCL at suppressing Li-dendrite formation, as the former enhanced the modulus and Li-ion conductivity, inducing Liion deposition below the passivation layer. The p-PCL-coated Li electrode maintains state-of-the-art stable dendrite-free cycling behavior with overpotentials of similar to 11.10 and similar to 79.84 mV over 16 450 and 2472 h at 1 and 10 mA cm(-2), respectively.
- Keywords
- LITHIUM METAL; ANODE; CONDUCTIVITY; INTERPHASES; DEPOSITION; GRAPHITE; FILM; LITHIUM METAL; ANODE; CONDUCTIVITY; INTERPHASES; DEPOSITION; GRAPHITE; FILM; Metal-Semiconductor; Ohimic and Schottky contact; Interface; Stable; Li-Metal Electrodes
- ISSN
- 2380-8195
- URI
- https://pubs.kist.re.kr/handle/201004/117141
- DOI
- 10.1021/acsenergylett.1c00150
- Appears in Collections:
- KIST Article > 2021
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