Material design for Ge2Sb2Te5 phase-change material with thermal stability and lattice distortion

Authors
Choi, MinhoChoi, HeechaeAhn, JinhoKim, Yong Tae
Issue Date
2019-09
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
SCRIPTA MATERIALIA, v.170, pp.16 - 19
Abstract
To overcome the reliability issue of phase-change memory, the development of stable phase-change materials is extremely important. In this study, we analyze 13 dopants for Ge2Sb2Te5 (GST) based on two criteria: i) the change in thermal stability by doping and ii) a lattice distortion. After doping the elements, 11 elements showed a negative doping formation energy compared with pure GST. The angular distortion of the Zn dopant is the largest. The hole carrier decreases, and the electrical resistance increases through Zn-doping in GST. The increased resistance of the material can lead to low power consumption with a high energy effectiveness. (C) 2019 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Keywords
GENERALIZED GRADIENT APPROXIMATION; DOPED GE2SB2TE5; ELECTRICAL-PROPERTIES; FILMS; GENERALIZED GRADIENT APPROXIMATION; DOPED GE2SB2TE5; ELECTRICAL-PROPERTIES; FILMS; Phase-change material; Phase-change memory; Doping; Ge2Sb2Te5; Lattice distortion
ISSN
1359-6462
URI
https://pubs.kist.re.kr/handle/201004/119623
DOI
10.1016/j.scriptamat.2019.05.024
Appears in Collections:
KIST Article > 2019
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE