Material design for Ge2Sb2Te5 phase-change material with thermal stability and lattice distortion
- Authors
- Choi, Minho; Choi, Heechae; Ahn, Jinho; Kim, Yong Tae
- Issue Date
- 2019-09
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Citation
- SCRIPTA MATERIALIA, v.170, pp.16 - 19
- Abstract
- To overcome the reliability issue of phase-change memory, the development of stable phase-change materials is extremely important. In this study, we analyze 13 dopants for Ge2Sb2Te5 (GST) based on two criteria: i) the change in thermal stability by doping and ii) a lattice distortion. After doping the elements, 11 elements showed a negative doping formation energy compared with pure GST. The angular distortion of the Zn dopant is the largest. The hole carrier decreases, and the electrical resistance increases through Zn-doping in GST. The increased resistance of the material can lead to low power consumption with a high energy effectiveness. (C) 2019 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
- Keywords
- GENERALIZED GRADIENT APPROXIMATION; DOPED GE2SB2TE5; ELECTRICAL-PROPERTIES; FILMS; GENERALIZED GRADIENT APPROXIMATION; DOPED GE2SB2TE5; ELECTRICAL-PROPERTIES; FILMS; Phase-change material; Phase-change memory; Doping; Ge2Sb2Te5; Lattice distortion
- ISSN
- 1359-6462
- URI
- https://pubs.kist.re.kr/handle/201004/119623
- DOI
- 10.1016/j.scriptamat.2019.05.024
- Appears in Collections:
- KIST Article > 2019
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