Intrinsic Optoelectronic Characteristics of MoS2 Phototransistors via a Fully Transparent van der Waals Heterostructure
- Authors
- Pak, Jinsu; Lee, Ilmin; Cho, Kyungjune; Kim, Jae-Keun; Jeong, Hyunhak; Hwang, Wang-Taek; Ahn, Geun Ho; Kang, Keehoon; Yu, Woo Jong; Javey, Ali; Chung, Seungjun; Lee, Takhee
- Issue Date
- 2019-08
- Publisher
- AMER CHEMICAL SOC
- Citation
- ACS NANO, v.13, no.8, pp.9638 - 9646
- Abstract
- In the past decade, intensive studies on monolayer MoS2-based phototransistors have been carried. However, the intrinsic optoelectronic characteristics because of unintended interferences, such as multiple reflections of incident light originating from commonly used opaque substrates. This leads to overestimated out to achieve further enhanced optoelectronic character of monolayer MoS2 have still not been explored until now photoresponsive characteristics inevitably due to the enhanced photogating and photoconductive effects. Here, we reveal the intrinsic photoresponsive characteristics of monolayer MoS2 including its internal responsivity and quantum efficiency, in fully transparent monolayer MoS2 phototransistors employing a van der Waals heterostructure. Interestingly, as opposed to the previous reports, the internal photoresponsive characteristics do not significantly depend on the wavelength of the incident light as long as the electron hole pairs are generated in the same k-space. This study provides a deeper understanding of the photoresponsive characteristics of MoS2 and lays the foundation for two-dimensional materials-based transparent phototransistors.
- Keywords
- LAYER; PHOTODETECTOR; GAIN; LAYER; PHOTODETECTOR; GAIN; MoS2; phototransistor; heterostructure; internal quantum efficiency; internal responsivity
- ISSN
- 1936-0851
- URI
- https://pubs.kist.re.kr/handle/201004/119733
- DOI
- 10.1021/acsnano.9b04829
- Appears in Collections:
- KIST Article > 2019
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