Polarized Raman studies of single GaN nanowire and GaN/AlN hetero-nanowire structures
- Authors
 - Lee, Taegeon; Kim, Jin Heung; Choi, Young-Jin; Park, Jae-Gwan; Rho, Heesuk
 
- Issue Date
 - 2019-02-01
 
- Publisher
 - ELSEVIER SCIENCE SA
 
- Citation
 - THIN SOLID FILMS, v.671, pp.147 - 151
 
- Abstract
 - We report the Raman results obtained from single GaN, GaN/AlN core-shell, and GaN/AlN branched nanowires (NWs). Polarized Raman spectra from a single GaN NW showed strong anisotropic behavior, in agreement with the Raman polarization selection rules for a wurtzite crystal, indicating the high crystalline quality of the NW. A Raman spectrum from a single GaN NW revealed several optical phonons, including A(1)(TO), A(1)(LO), and E-2(H) phonons at 530.5, 724.2, and 567.0 cm(-1), respectively. Fabricating an AlN shell layer on the side wall of the GaN core NW shifted the GaN A(1)(LO) phonon energy upward by 5.7 cm(-1), indicating that compressive strain occurred in the GaN core. The formation of AlN nanorod branches on the GaN/AlN core-shell surface shifted the A(1)(LO) phonon energy downward toward the value of the GaN NW, indicating a relaxation of the compressive strain in the GaN core. In particular, a broad phonon response was observed at 691.8 cm(-1) on the low-energy shoulder of the GaN A(1)(LO) phonon peak. A careful analysis of this mode identified that the 691.8 cm(-1) mode corresponded to a defect-related phonon, not to a surface optical phonon.
 
- Keywords
 - SCATTERING; PHONONS; GROWTH; SCATTERING; PHONONS; GROWTH; Raman spectroscopy; Gallium nitride; Aluminum nitride; Nanowire
 
- ISSN
 - 0040-6090
 
- URI
 - https://pubs.kist.re.kr/handle/201004/120367
 
- DOI
 - 10.1016/j.tsf.2018.12.043
 
- Appears in Collections:
 - KIST Article > 2019
 
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