Origin of magnetic properties in carbon implanted ZnO nanowires

Authors
Wang, Y. F.Shao, Y. C.Hsieh, S. H.Chang, Y. K.Yeh, P. H.Hsueh, H. C.Chiou, J. W.Wang, H. T.Ray, S. C.Tsai, H. M.Pao, C. W.Chen, C. H.Lin, H. J.Lee, J. F.Wu, C. T.Wu, J. J.Chang, Y. M.Asokan, K.Chae, K. H.Ohigashi, T.Takagi, Y.Yokoyama, T.Kosugi, N.Pong, W. F.
Issue Date
2018-05-17
Publisher
NATURE PUBLISHING GROUP
Citation
SCIENTIFIC REPORTS, v.8
Abstract
Various synchrotron radiation-based spectroscopic and microscopic techniques are used to elucidate the room-temperature ferromagnetism of carbon-doped ZnO-nanowires (ZnO-C:NW) via a mild C+ ion implantation method. The photoluminescence and magnetic hysteresis loops reveal that the implantation of C reduces the number of intrinsic surface defects and increases the saturated magnetization of ZnO-NW. The interstitial implanted C ions constitute the majority of defects in ZnO-C:NW as confirmed by the X-ray absorption spectroscopic studies. The X-ray magnetic circular dichroism spectra of O and C K-edge respectively indicate there is a reduction in the number of unpaired/dangling O 2p bonds in the surface region of ZnO-C:NW and the C 2p-derived states of the implanted C ions strongly affect the net spin polarization in the surface and bulk regions of ZnO-C:NW. Furthermore, these findings corroborate well with the first-principles calculations of C-implanted ZnO in surface and bulk regions, which highlight the stability of implanted C for the suppression and enhancement of the ferromagnetism of the ZnO-C:NW in the surface region and bulk phase, respectively.
Keywords
RAY-ABSORPTION SPECTROSCOPY; ELECTRONIC-STRUCTURE; NANOSTRUCTURES; FERROMAGNETISM; SEMICONDUCTORS; BACKSCATTERING; MICROSCOPY; EMISSION; VACANCY; RAY-ABSORPTION SPECTROSCOPY; ELECTRONIC-STRUCTURE; NANOSTRUCTURES; FERROMAGNETISM; SEMICONDUCTORS; BACKSCATTERING; MICROSCOPY; EMISSION; VACANCY; synchrotron radiation; room-temperature ferromagnetism; carbon-doped ZnO-nanowires; ion implantation
ISSN
2045-2322
URI
https://pubs.kist.re.kr/handle/201004/121369
DOI
10.1038/s41598-018-25948-x
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KIST Article > 2018
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