Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | El Dirani, H. | - |
dc.contributor.author | Lee, K. H. | - |
dc.contributor.author | Parihar, M. S. | - |
dc.contributor.author | Lacord, J. | - |
dc.contributor.author | Martinie, S. | - |
dc.contributor.author | Barbe, J-Ch. | - |
dc.contributor.author | Mescot, X. | - |
dc.contributor.author | Fonteneau, P. | - |
dc.contributor.author | Broquin, J. -E. | - |
dc.contributor.author | Ghibaudo, G. | - |
dc.contributor.author | Galy, Ph | - |
dc.contributor.author | Gamiz, F. | - |
dc.contributor.author | Taur, Y. | - |
dc.contributor.author | Kim, Y. -T. | - |
dc.contributor.author | Cristoloveanu, S. | - |
dc.contributor.author | Bawedin, M. | - |
dc.date.accessioned | 2024-01-20T01:04:18Z | - |
dc.date.available | 2024-01-20T01:04:18Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 2017-06-25 | - |
dc.identifier.issn | 0167-9317 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/122613 | - |
dc.description.abstract | A systematic study of a capacitorless 1T-DRAM fabricated in 28 nm FDSOI technology is presented. The operation mechanism is based on band modulation. The Z(2)-FET memory cell features a large current sense margin and small OFF-state current at 25 degrees C and 85 degrees C. Moreover, low power consumption during state '1' writing is achieved with similar to 0.5 V programming voltage. These specifications make the Z(2)-FET an outstanding candidate for low-power eDRAM applications. (C) 2017 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER | - |
dc.subject | CAPACITORLESS 1T-DRAM | - |
dc.subject | GATE | - |
dc.subject | Z(2)-FET | - |
dc.subject | DEVICES | - |
dc.title | Ultra-low power 1T-DRAM in FDSOI technology | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.mee.2017.05.047 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | MICROELECTRONIC ENGINEERING, v.178, pp.245 - 249 | - |
dc.citation.title | MICROELECTRONIC ENGINEERING | - |
dc.citation.volume | 178 | - |
dc.citation.startPage | 245 | - |
dc.citation.endPage | 249 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000404703800056 | - |
dc.identifier.scopusid | 2-s2.0-85019871691 | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | CAPACITORLESS 1T-DRAM | - |
dc.subject.keywordPlus | GATE | - |
dc.subject.keywordPlus | Z(2)-FET | - |
dc.subject.keywordPlus | DEVICES | - |
dc.subject.keywordAuthor | Fully Depleted Silicon-On-Insulator (FDSOI) | - |
dc.subject.keywordAuthor | Sharp switch | - |
dc.subject.keywordAuthor | Z(2)-FET | - |
dc.subject.keywordAuthor | Low-power | - |
dc.subject.keywordAuthor | Embedded memory | - |
dc.subject.keywordAuthor | 1T-DRAM | - |
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