Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Lee, Young Tack | - |
dc.contributor.author | Hwang, Do Kyung | - |
dc.contributor.author | Choi, Won Kook | - |
dc.date.accessioned | 2024-01-20T03:04:23Z | - |
dc.date.available | 2024-01-20T03:04:23Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 2016-10 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/123596 | - |
dc.description.abstract | Two-dimensional (2D) van der Waals (vdW) atomic crystals have been extensively studied and significant progress has been made. The newest 2D vdW material, called black phosphorus (BP), has attracted considerable attention due to its unique physical properties, such as its being a singlecomponent material like graphene, and its having a high mobility and direct band gap. Here, we report on a high-performance BP nanosheet based ferroelectric field effect transistor (FeFET) with a poly(vinylidenefluoride-trifluoroethylene) top-gate insulator for a nonvolatile memory application. The BP FeFETs show the highest linear hole mobility of 563 cm(2)/Vs and a clear memory window of more than 15 V. For more advanced nonvolatile memory circuit applications, two different types of resistive-load and complementary ferroelectric memory inverters were implemented, which showed distinct memory on/off switching characteristics. | - |
dc.language | English | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.subject | FIELD-EFFECT TRANSISTORS | - |
dc.subject | P-N DIODE | - |
dc.subject | LAYER | - |
dc.subject | METAL | - |
dc.subject | GAP | - |
dc.subject | HETEROJUNCTION | - |
dc.subject | JUNCTIONS | - |
dc.subject | CONTACTS | - |
dc.subject | MOBILITY | - |
dc.title | High-performance black phosphorus top-gate ferroelectric transistor for nonvolatile memory applications | - |
dc.type | Article | - |
dc.identifier.doi | 10.3938/jkps.69.1347 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.69, no.8, pp.1347 - 1351 | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 69 | - |
dc.citation.number | 8 | - |
dc.citation.startPage | 1347 | - |
dc.citation.endPage | 1351 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.identifier.kciid | ART002162942 | - |
dc.identifier.wosid | 000387383700012 | - |
dc.identifier.scopusid | 2-s2.0-85013872760 | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | FIELD-EFFECT TRANSISTORS | - |
dc.subject.keywordPlus | P-N DIODE | - |
dc.subject.keywordPlus | LAYER | - |
dc.subject.keywordPlus | METAL | - |
dc.subject.keywordPlus | GAP | - |
dc.subject.keywordPlus | HETEROJUNCTION | - |
dc.subject.keywordPlus | JUNCTIONS | - |
dc.subject.keywordPlus | CONTACTS | - |
dc.subject.keywordPlus | MOBILITY | - |
dc.subject.keywordAuthor | Black Phosphorus (BP) | - |
dc.subject.keywordAuthor | Ferroelectric field-effect transistor (FeFET) | - |
dc.subject.keywordAuthor | Nonvolatile memory | - |
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