High-performance black phosphorus top-gate ferroelectric transistor for nonvolatile memory applications
- Authors
- Lee, Young Tack; Hwang, Do Kyung; Choi, Won Kook
- Issue Date
- 2016-10
- Publisher
- KOREAN PHYSICAL SOC
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.69, no.8, pp.1347 - 1351
- Abstract
- Two-dimensional (2D) van der Waals (vdW) atomic crystals have been extensively studied and significant progress has been made. The newest 2D vdW material, called black phosphorus (BP), has attracted considerable attention due to its unique physical properties, such as its being a singlecomponent material like graphene, and its having a high mobility and direct band gap. Here, we report on a high-performance BP nanosheet based ferroelectric field effect transistor (FeFET) with a poly(vinylidenefluoride-trifluoroethylene) top-gate insulator for a nonvolatile memory application. The BP FeFETs show the highest linear hole mobility of 563 cm(2)/Vs and a clear memory window of more than 15 V. For more advanced nonvolatile memory circuit applications, two different types of resistive-load and complementary ferroelectric memory inverters were implemented, which showed distinct memory on/off switching characteristics.
- Keywords
- FIELD-EFFECT TRANSISTORS; P-N DIODE; LAYER; METAL; GAP; HETEROJUNCTION; JUNCTIONS; CONTACTS; MOBILITY; FIELD-EFFECT TRANSISTORS; P-N DIODE; LAYER; METAL; GAP; HETEROJUNCTION; JUNCTIONS; CONTACTS; MOBILITY; Black Phosphorus (BP); Ferroelectric field-effect transistor (FeFET); Nonvolatile memory
- ISSN
- 0374-4884
- URI
- https://pubs.kist.re.kr/handle/201004/123596
- DOI
- 10.3938/jkps.69.1347
- Appears in Collections:
- KIST Article > 2016
- Files in This Item:
There are no files associated with this item.
- Export
- RIS (EndNote)
- XLS (Excel)
- XML
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.