Chemical free device fabrication of two dimensional van der Waals materials based transistors by using one-off stamping

Authors
Lee, Young TackChoi, Won KookHwang, Do Kyung
Issue Date
2016-06-20
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.108, no.25
Abstract
We report on a chemical free one-off imprinting method to fabricate two dimensional (2D) van der Waals (vdWs) materials based transistors. Such one-off imprinting technique is the simplest and effective way to prevent unintentional chemical reaction or damage of 2D vdWs active channel during device fabrication process. 2D MoS2 nanosheets based transistors with a hexagonal-boron-nitride (h-BN) passivation layer, prepared by one-off imprinting, show negligible variations of transfer characteristics after chemical vapor deposition process. In addition, this method enables the fabrication of all 2D MoS2 transistors consisting of h-BN gate insulator, and graphene source/drain and gate electrodes without any chemical damage. Published by AIP Publishing.
Keywords
FIELD-EFFECT TRANSISTORS; SINGLE-LAYER MOS2; GRAPHENE; PERFORMANCE; CIRCUITS; FIELD-EFFECT TRANSISTORS; SINGLE-LAYER MOS2; GRAPHENE; PERFORMANCE; CIRCUITS; two dimensional (2D) van der Waals (vdWs) materials; chemical free one-off imprinting method
ISSN
0003-6951
URI
https://pubs.kist.re.kr/handle/201004/123958
DOI
10.1063/1.4954223
Appears in Collections:
KIST Article > 2016
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