Effect of processing parameters on the formation of large area self-assembled monolayer of polystyrene beads by a convective self-assembly method
- Authors
- Seo, A.-N.; Choi, J.-H.; Pyun, J.-C.; Kim, W.M.; Kim, I.; Lee, K.-S.
- Issue Date
- 2015-12
- Publisher
- Korea Federation of Science and Technology
- Citation
- Korean Journal of Materials Research, v.25, no.12, pp.647 - 654
- Abstract
- Self-assembled monolayers(SAM) of microspheres such as silica and polystyrene(PS) beads have found widespread application in photonic crystals, sensors, and lithographic masks or templates. From a practical viewpoint, setting up a highthroughput process to form a SAM over large areas in a controllable manner is a key challenging issue. Various methods have been suggested including drop casting, spin coating, Langmuir Blodgett, and convective self-assembly(CSA) techniques. Among these, the CSA method has recently attracted attention due to its potential scalability to an automated high-throughput process. By controlling various parameters, this process can be precisely tuned to achieve well-ordered arrays of microspheres. In this study, using a restricted meniscus CSA method, we systematically investigate the effect of the processing parameters on the formation of large area self-assembled monolayers of PS beads. A way to provide hydrophilicity, a prerequisite for a CSA, to the surface of a hydrophobic photoresist layer, is presented in order to apply the SAM of the PS beads as a mask for photonic nanojet lithography. ? Materials Research Society of Korea.
- Keywords
- Microspheres; Monolayers; Organic polymers; Photoresists; Polystyrenes; Self assembly; Throughput; Convective self-assembly; High throughput; Langmuir-blodgett; Lithographic mask; Photonic nanojet; Photoresist layers; Polystyrene beads; Processing parameters; Self assembled monolayers; Microspheres; Monolayers; Organic polymers; Photoresists; Polystyrenes; Self assembly; Throughput; Convective self-assembly; High throughput; Langmuir-blodgett; Lithographic mask; Photonic nanojet; Photoresist layers; Polystyrene beads; Processing parameters; Self assembled monolayers; Convective self-assembly method; High-throughput process; Large area monolayer; Polystyrene bead
- ISSN
- 1225-0562
- URI
- https://pubs.kist.re.kr/handle/201004/124730
- DOI
- 10.3740/MRSK.2015.25.12.647
- Appears in Collections:
- KIST Article > 2015
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