Effects of Processing Temperatures of Nickel Plating on Capacitance Density of Alumina Film Capacitor

Authors
Jeong, Myung-SunJu, Byeong-KwonLee, Jeon-Kook
Issue Date
2015-06
Publisher
AMER SCIENTIFIC PUBLISHERS
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.15, no.6, pp.4530 - 4533
Abstract
We observed the effects of nickel plating temperatures for controlling the surface morphologies of the deposited nickel layers on the alumina nano-pores. The alumina nano-channels were filled with nickel at various processing temperatures of 60 similar to 90 degrees C. The electrical properties of the alumina film capacitors were changed with processing temperatures. The electroless nickel plating (ENP) at 60 degrees C improved the nickel penetration into the alumina nano-channels due to the reduced reaction rate. Nickel layers are uniformly formed on the high aspect ratio alumina pores. Due to the uniform nickel electrode, the capacitance density of the alumina film capacitors is improved by the low leakage current, dissipation factor and equivalent series resistance. Alumina film capacitors made by ENP at 60 degrees C had a high capacitance density of 160 nF/cm(2).
Keywords
POLYETHYLENE-GLYCOL; COPPER; POLYETHYLENE-GLYCOL; COPPER; Alumina Film Capacitor; Electroless Plating; Alumina Nano-Channel; Nickel Electrode; Processing Temperature
ISSN
1533-4880
URI
https://pubs.kist.re.kr/handle/201004/125373
DOI
10.1166/jnn.2015.9781
Appears in Collections:
KIST Article > 2015
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