Raman scattering studies of Cu2ZnSnS4 thin films: Local distribution of the secondary phase Cu2-x S and the effect of KCN etching on Cu2-x S

Authors
Trang Thi Thu NguyenShin, Hae-YoungKim, Gee YeongKim, Ju RiJo, WilliamYoon, SeokhyunLee, Ki DooKim, Jin Young
Issue Date
2015-01
Publisher
KOREAN PHYSICAL SOC
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.66, no.1, pp.117 - 122
Abstract
We used X-ray diffraction (XRD) and Raman scattering spectroscopy to study Cu2ZnSnS4 (CZTS) thin films grown by using an electroplating method. We compared the Raman spectra of the CZTS thin films before and after potassium cyanide (KCN) etching. We observed a phonon mode of the secondary phase Cu2-x S both from Cu-rich and Cu-poor CZTS samples before the KCN etching. We found that the intensity of the Cu2-x S-related vibration mode depended on the excitation wavelength, from which we could estimate the stoichiometry of the Cu2-x S as x = 1. Interestingly, the Cu2-x S phonon is completely removed after the KCN etching. We could also get information regarding the local distribution of the secondary phase on the surfaces of the CZTS thin films by using micro-Raman scattering spectroscopy.
Keywords
SULFURIZATION; ABSORBERS; CZTS; Raman scattering spectroscopy; Electroplating; KCN etching; Secondary phase
ISSN
0374-4884
URI
https://pubs.kist.re.kr/handle/201004/125885
DOI
10.3938/jkps.66.117
Appears in Collections:
KIST Article > 2015
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE