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전자현미경 기반의 차세대 핵심 나노분석기술

Authors

조진우; 김성훈; 변영운; 안재평

Issue Date

2015-01

Publisher

대한금속재료학회 (구 대한금속학회)

Citation

재료마당 = Trends in metals & materials engineering, v.28, no.1, pp.24 - 41

Keywords

TEM; Atom Probe; Hysitron

ISSN

1738-7507

URI

https://pubs.kist.re.kr/handle/201004/125903

Appears in Collections:

KIST Article > 2015

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