Characteristics of ZnO Thin Film Transistors Fabricated Using a Microwave Sol-Gel Method

Authors
Kim, KyongminKim, EunkyeomKim, YoungillPark, Kyoungwan
Issue Date
2014-02
Publisher
KOREAN INST METALS MATERIALS
Citation
KOREAN JOURNAL OF METALS AND MATERIALS, v.52, no.2, pp.155 - 161
Abstract
We synthesized a gel-like phase of zinc oxide (ZnO) by employing a microwave-assisted technique and then used this gel-like phase to fabricate ZnO thin film transistors (TFTs). By utilizing this method, we were able to prepare the ZnO gel-like phase in a relatively short time and obtained polycrystalline ZnO thin films This microwave-assisted technique also allows the use of low-temperature thermal processes in the fabrication of ZnO-TFTs. The bottom-gate TFTs with a ZnO layer as the active channel exhibited a field effect mobility of 0.6 cm(2)/V.s, a sub-threshold slope of 9 V/decade, and an on/off current ratio greater than 10(4). These results point to the possibility of using microwave-assisted techniques for transparent and flexible electronic devices based on ZnO.
Keywords
TEMPERATURE; DEPOSITION; ZnO; semiconductors; sol-gel; electrical properties; TEM
ISSN
1738-8228
URI
https://pubs.kist.re.kr/handle/201004/127124
DOI
10.3365/KJMM.2014.52.2.155
Appears in Collections:
KIST Article > 2014
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