KIST Library Institutional Repository

비행시간형 이차이온질량분석(TOF-SIMS) 장비를 이용한 고분자 표면분석 및 최근동향

Other Titles

Characterization of Polymer Surface by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Authors

이연희; 이지혜

Issue Date

2013-10

Citation

Polymer Science and Technology, v.24, no.5, pp.528 - 534

ISSN

1225-0260

URI

https://pubs.kist.re.kr/handle/201004/127559

Appears in Collections:

KIST Article > 2013

Files in This Item:

There are no files associated with this item.

Export

RIS (EndNote)

XLS (Excel)

XML