Relationship between phase and generation mechanisms of THz waves in InAs

Authors
Jeong, H.Shin, S. H.Kim, S. Y.Song, J. D.Choi, S. B.Lee, D. S.Lee, J.Jho, Y. D.
Issue Date
2012-05
Publisher
ELSEVIER SCIENCE BV
Citation
CURRENT APPLIED PHYSICS, v.12, no.3, pp.668 - 672
Abstract
We investigated the thickness-dependent characteristics of THz waves from InAs epilayers whose thickness ranges from 0.01 to 1.74 mu m. The amplitude showed monotonic increments up to 0.9 mu m, followed by a saturation at 1.74 mu m. Interestingly, the phase of THz waves was reversed around absorption depth and used to identify the transient dipole direction based on simulated band diagram. We could further distinguish dominant THz wave generation mechanisms, associated with the phase information. (C) 2011 Elsevier B. V. All rights reserved.
Keywords
TERAHERTZ-EMISSION; POLARIZATION; RADIATION; FIELD; TERAHERTZ-EMISSION; POLARIZATION; RADIATION; FIELD; Terahertz; InAs; Phase shift; Diffusion; Photo-Dember effect
ISSN
1567-1739
URI
https://pubs.kist.re.kr/handle/201004/129288
DOI
10.1016/j.cap.2011.10.002
Appears in Collections:
KIST Article > 2012
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