Fabrication of 1 μm thickness lead zirconium titanate films using poly(N-vinylpyrrolidone) added sol-gel method
- Authors
- Oh, S.M.; Kang, M.-G.; Do, Y.H.; Kang, C.Y.; Yoon, S.J.; Nahm, S.
- Issue Date
- 2011-10
- Publisher
- Korean Institute of Electrical and Electronic Material Engineers
- Citation
- Transactions on Electrical and Electronic Materials, v.12, no.5, pp.222 - 225
- Abstract
- Lead zirconate titanate (PZT) films were fabricated on Pt/Ti/SiO2/Si substrate by the sol-gel method using a sol containing poly(N-vinylpyrrolidone) (PVP). PVP in alkoxide solutions can suppress the condensation reaction in gel films during heat treatment, and increase the viscosity of alkoxide solutions. Single-phase PZT films as thick as 1 μm were deposited by repetitive coating with successive third-step heat treatments at 150°C, 350°C and 650°C;. After heat treatment, the films were crack free, and optically transparent. As a result, we demonstrated a PZT film with a PVP molar ratio of 0.5, which has a permittivity of 734, a dielectric loss of 0.042, a Pr of 40.5 μC/cm2 and an Ec of 156 kV/cm. ? 2011 KIEEME. All rights reserved.
- Keywords
- Condensation reactions; Dielectric losses; Gels; Heat treatment; Semiconducting lead compounds; Sol-gels; Sols; Zirconium; After-heat treatment; Alkoxide solutions; Crack free; Gel films; Lead zirconate titanate; Lead zirconium titanate; Lead-zirconate-titanate films; Molar ratio; N vinylpyrrolidone; Poly(vinyl pyrrolidone); Poly-N-vinylpyrrolidone; PZT film; Sol-gel process; Condensation reactions; Dielectric losses; Gels; Heat treatment; Semiconducting lead compounds; Sol-gels; Sols; Zirconium; After-heat treatment; Alkoxide solutions; Crack free; Gel films; Lead zirconate titanate; Lead zirconium titanate; Lead-zirconate-titanate films; Molar ratio; N vinylpyrrolidone; Poly(vinyl pyrrolidone); Poly-N-vinylpyrrolidone; PZT film; Sol-gel process; Lead zirconate titanate; Poly(vinylpyrrolidone); Sol-gel; Thickness control
- ISSN
- 1229-7607
- URI
- https://pubs.kist.re.kr/handle/201004/129968
- DOI
- 10.4313/TEEM.2011.12.5.222
- Appears in Collections:
- KIST Article > 2011
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