DSpace at KISTKIST Article2011

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dc.contributor.authorYang, Min Kyu-
dc.contributor.authorPark, Jae-Wan-
dc.contributor.authorLee, Jeon-Kook-
dc.date.accessioned2024-01-20T16:33:32Z-
dc.date.available2024-01-20T16:33:32Z-
dc.date.created2021-09-04-
dc.date.issued2011-08-
dc.identifier.issn1598-9623-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/130144-
dc.description.abstractHeteroepitaxial Cr-doped SrZrO3 thin films were grown on 200 nm-thick SrRuO3 films deposited on SrTiO3 (100) substrates by pulsed laser deposition. The Cr-doped SrZrO3 films on the SrRuO3 bottom electrode exhibited an XRD peak for the (hh0/00l) planes of SrZrO3 and SrRuO3 thin films, showing a good epitaxial relationship. The I-V characteristics of the Au/Cr-doped SrZrO3/SrRuO3 MIM structures revealed resistance switching behavior with an ON/OFF resistance ratio of 20.-
dc.languageEnglish-
dc.publisherKOREAN INST METALS MATERIALS-
dc.subjectNONVOLATILE MEMORY-
dc.titleResistance switching of heteroepitaxial Cr-doped SrZrO3 thin films-
dc.typeArticle-
dc.identifier.doi10.1007/s12540-011-0818-4-
dc.description.journalClass1-
dc.identifier.bibliographicCitationMETALS AND MATERIALS INTERNATIONAL, v.17, no.4, pp.637 - 640-
dc.citation.titleMETALS AND MATERIALS INTERNATIONAL-
dc.citation.volume17-
dc.citation.number4-
dc.citation.startPage637-
dc.citation.endPage640-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.identifier.kciidART001609193-
dc.identifier.wosid000294958900018-
dc.identifier.scopusid2-s2.0-80053182163-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.type.docTypeArticle-
dc.subject.keywordPlusNONVOLATILE MEMORY-
dc.subject.keywordAuthorelectrical/electronic materials-
dc.subject.keywordAuthordeposition-
dc.subject.keywordAuthordefects-
dc.subject.keywordAuthorepitaxy-
dc.subject.keywordAuthoratomic force microscopy (AFM)-
dc.subject.keywordAuthorSrZrO3-
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