The effect of the concentration and oxidation state of Sn on the structural and electrical properties of indium tin oxide nanowires

Authors
Park, Kyung-SooChoi, Young-JinKang, Jin-GuSung, Yun-MoPark, Jae-Gwan
Issue Date
2011-07-15
Publisher
IOP PUBLISHING LTD
Citation
NANOTECHNOLOGY, v.22, no.28
Abstract
High quality single-crystalline indium tin oxide (ITO) nanowires with controlled Sn contents of up to 32.5 at.% were successfully synthesized via a thermal metal co-evaporation method, based on a vapor-liquid-solid growth mode, at a substrate temperature of as low as 540 degrees C. The high solubility of Sn in the nanowires was explained with the existence of Sn2+ ions along with Sn4+ ions: the coexistence of Sn2+ and Sn4+ ions facilitated their high substitutional incorporation into the In2O3 lattice by relaxing structural and electrical disturbances due to the differences in ionic radii and electrical charges between Sn and In3+ ions. It was revealed that, while the lattice parameter of the ITO nanowires had a minimum value at a Sn content of 6.3 at.%, the electrical resistivity had a minimum value of about 10(-3) Omega cm at a Sn content of 14 at.%. These structural and electrical behaviors were explained by variation in the relative and total amounts of the two species, Sn2+ and Sn4+.
Keywords
THIN-FILMS; X-RAY; LOW-TEMPERATURE; SOLAR-CELL; ITO; DEPOSITION; GROWTH; THIN-FILMS; X-RAY; LOW-TEMPERATURE; SOLAR-CELL; ITO; DEPOSITION; GROWTH; ITO; nanowires; resistivity; solubility; XPS
ISSN
0957-4484
URI
https://pubs.kist.re.kr/handle/201004/130179
DOI
10.1088/0957-4484/22/28/285712
Appears in Collections:
KIST Article > 2011
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE